Tae-Hwang Jang
Engineer at Samsung Electronics Co Ltd
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 17 December 2003 Paper
Tae Jang, Jong-Bae Lee, Jae-Pil Shin, Kwang-Jai Yoo, Dai-Hyun Jung, Yong-Hee Park, Moon-Hyun Yoo, Jeong-Taek Kong
Proceedings Volume 5256, (2003) https://doi.org/10.1117/12.517828
KEYWORDS: Data conversion, Data processing, Vestigial sideband modulation, Computer aided design, Critical dimension metrology, Mask making, Resolution enhancement technologies, Control systems, Raster graphics, Manufacturing

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