Tega B. Edo
at Sheffield Univ
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 26 July 2011 Paper
D. Claus, A. M. Maiden, F. Zhang, A. Hurst, T. Edo, F. Sweeney, J. M. Rodenburg, H. Schluesener, M. J. Humphry
Proceedings Volume 8001, 800109 (2011) https://doi.org/10.1117/12.893512
KEYWORDS: Diffraction, Phase retrieval, Super resolution, Digital holography, Microscopy, Optical resolution, Visible radiation, X-ray microscopy, Phase contrast, Holography

Proceedings Article | 3 June 2010 Paper
T. Edo, F. Zhang, J. Rodenburg
Proceedings Volume 7729, 77291H (2010) https://doi.org/10.1117/12.853346
KEYWORDS: Diffraction, Coherence imaging, Image resolution, Image restoration, Microscopy, Signal to noise ratio, Sensors, Scattering, Ions, Super resolution

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