Dr. Tomi Tuohimaa
Senior Scientist at Excillum AB
SPIE Involvement:
Author
Publications (6)

Proceedings Article | 9 September 2019 Presentation
Anasuya Adibhatla, Tomi Tuohimaa, Fei Yang
Proceedings Volume 11112, 111120Q (2019) https://doi.org/10.1117/12.2528469
KEYWORDS: Nanoimaging, X-rays, X-ray sources, X-ray computed tomography, X-ray optics, Prototyping, X-ray technology, X-ray diffraction, Scattering, Tungsten

Proceedings Article | 9 March 2017 Paper
Mark Müller, Sebastian Allner, Simone Ferstl, Martin Dierolf, Tomi Tuohimaa, Franz Pfeiffer
Proceedings Volume 10132, 101320L (2017) https://doi.org/10.1117/12.2254785
KEYWORDS: X-rays, X-ray imaging, X-ray sources, X-ray computed tomography, Image resolution, Sensors, Visualization, Teeth, X-ray optics, X-ray detectors

Proceedings Article | 11 September 2014 Paper
Emil Espes, Tommy Andersson, Fredrik Björnsson, Christina Gratorp, Björn Hansson, Oscar Hemberg, Göran Johansson, Johan Kronstedt, Mikael Otendal, Tomi Tuohimaa, Per Takman
Proceedings Volume 9212, 92120J (2014) https://doi.org/10.1117/12.2061612
KEYWORDS: X-rays, Indium, Tomography, Gallium, X-ray sources, X-ray technology, X-ray imaging, Metals, Electrons, Liquids

Proceedings Article | 11 September 2014 Paper
F. Nachtrab, M. Firsching, N. Uhlmann, C. Speier, P. Takman, T. Tuohimaa, C. Heinzl, J. Kastner, D. Larsson, A. Holmberg, G. Berti, M. Krumm, C. Sauerwein
Proceedings Volume 9212, 92120L (2014) https://doi.org/10.1117/12.2061752
KEYWORDS: Sensors, X-rays, Prototyping, X-ray optics, X-ray detectors, Inspection, Detector development, Time metrology, Calibration, Signal to noise ratio

Proceedings Article | 10 September 2005 Paper
Proceedings Volume 5918, 59180U (2005) https://doi.org/10.1117/12.616480
KEYWORDS: Electron beams, X-ray sources, X-rays, Hard x-rays, X-ray imaging, Magnetism, Surgery, Optical simulations, Biomedical optics, Coherent x-ray sources

Showing 5 of 6 publications
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