Wakahiko Sakata
at Dai Nippon Printing Co Ltd
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 26 May 2010 Paper
Proceedings Volume 7748, 77481M (2010) https://doi.org/10.1117/12.864104
KEYWORDS: Chemical mechanical planarization, Photomasks, Vestigial sideband modulation, Current controlled current source

Proceedings Article | 9 November 2005 Paper
Proceedings Volume 5992, 59924E (2005) https://doi.org/10.1117/12.633850
KEYWORDS: Inspection, Photomasks, Defect detection, Manufacturing, Defect inspection, Optical proximity correction, Data conversion, SRAF, Head, Chromium

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