Xiaodeng Duan
at Tianjin Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 12 March 2020 Paper
Proceedings Volume 11439, 114390M (2020) https://doi.org/10.1117/12.2543036
KEYWORDS: Sensors, 3D image processing, 3D metrology, 3D modeling, Collimation, Manufacturing, Calibration, Image processing

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