Yann Sperling
at Bremer Institute für angewandte Strahltechnik GmbH
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 20 June 2021 Poster + Presentation + Paper
Proceedings Volume 11787, 117870G (2021) https://doi.org/10.1117/12.2592295
KEYWORDS: Calibration, Cameras, Stereoscopic cameras, LCDs, Imaging systems, Visual process modeling, 3D metrology, Refraction, Ray tracing, Projection systems

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