Mask CD control (CDC) with ultrafast laser for improving mask CDU using AIMS as the CD metrology data source

Guy Ben-Zvi; Eitan Zait; Vladimir Dmitriev; Erez Graitzer; Gidi Gottlieb; Lior Leibovich; Robert Birkner; Klaus Boehm; Thomas Scheruebl

doi:10.1117/12.771190

31 October 2007 Mask CD control (CDC) with ultrafast laser for improving mask CDU using AIMS as the CD metrology data source

Guy Ben-Zvi, Eitan Zait, Vladimir Dmitriev, Erez Graitzer, Gidi Gottlieb, Lior Leibovich, Robert Birkner, Klaus Boehm, Thomas Scheruebl

Author Affiliations +

Proceedings Volume 6730, Photomask Technology 2007; 67304X (2007) https://doi.org/10.1117/12.771190
Event: SPIE Photomask Technology, 2007, Monterey, California, United States

Abstract

CD uniformity control by ultrafast laser system writing inside the bulk of photomasks has previously been shown to be an effective method for local CD Control (CDC) [1]. Intra-field CD variations correction has been implemented effectively in mask-shops and fabs based on CDC SEM [2, 3] and OCD as the CD data source. Using wafer CD data allows correction of all wafer field CD contributors at once, but does not allow correcting for mask CD signature alone. In case of a mask shop attempting to improve CDU of the mask regardless of a particular exposure tool, it is a better practice to use mask CD data by itself as the CD data source. We propose using an aerial imaging system AIMS^TM45-193i as the mask CD data source for the CDC process. In this study we created a programmed CD mask (65nm dense L/S) with relatively large CD errors. The programmed CD mask was then measured by AIMS^TM45-193i (AIMS45) which defined the CDU map of the programmed CD mask. The CDU data from AIMS^TM45-193i was then used by Pixer CDC101 to correct the CDU and bring it back to a flat almost ideal CDU.

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Guy Ben-Zvi, Eitan Zait, Vladimir Dmitriev, Erez Graitzer, Gidi Gottlieb, Lior Leibovich, Robert Birkner, Klaus Boehm, and Thomas Scheruebl "Mask CD control (CDC) with ultrafast laser for improving mask CDU using AIMS as the CD metrology data source", Proc. SPIE 6730, Photomask Technology 2007, 67304X (31 October 2007); https://doi.org/10.1117/12.771190

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