21 April 2022 Extreme ultraviolet scanner with high numerical aperture: obscuration and wavefront description
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Abstract

Background: A unique extreme ultraviolet (EUV-) scanner with a high numerical aperture (NA) of 0.55 was designed to enable printing of resolution lines with 8 nm half-pitch in a single exposure. The introduction of a central obscuration in the optics design reduces the angular load on the multilayer mirrors, enabling a high transmission and throughput. The central obscuration area has been minimized for best imaging, overlay, and transmission.

Aim: The wavefront is only available in the non-obscured area. This raises the question of how to describe such a wavefront.

Approach: We discuss the choice of fringe-Tatian basis functions to represent the wavefront for an obscured pupil. To make this choice, one needs to balance mathematical correctness while maintaining a simple and intuitive description.

Results: We provide a detailed analysis for selecting basis functions that are adequate to describe measured wavefronts on the non-obscured part of the pupil. This statement is supported by imaging simulations. A fast and stable evaluation of the chosen basis functions is presented. An adapted definition of the wavefront root-mean-square deviation for these functions is proposed; it has the advantage of being simple and independent of the number of basis functions used.

Conclusions: Because of the benefits of the proposed representation, the community is encouraged to use the same formalism.

© 2022 Society of Photo-Optical Instrumentation Engineers (SPIE) 1932-5150/2022/$28.00 © 2022 SPIE
Laurens de Winter, Timur Tudorovskiy, Jan van Schoot, Kars Troost, Erwin Stinstra, Stephen Hsu, Toralf Gruner, Juergen Mueller, Ruediger Mack, Bartosz Bilski, Joerg Zimmermann, and Paul Graeupner "Extreme ultraviolet scanner with high numerical aperture: obscuration and wavefront description," Journal of Micro/Nanopatterning, Materials, and Metrology 21(2), 023801 (21 April 2022). https://doi.org/10.1117/1.JMM.21.2.023801
Received: 23 September 2021; Accepted: 7 March 2022; Published: 21 April 2022
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CITATIONS
Cited by 4 scholarly publications.
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KEYWORDS
Wavefronts

Zernike polynomials

Scanners

Extreme ultraviolet

Spherical lenses

Monochromatic aberrations

Extreme ultraviolet lithography

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