Dr. James N. McNames
Associate Professor at Portland State Univ
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 17 May 2005 Paper
Daniel Tsunami, James McNames, Bruce Whitefield, Paul Rudolph, Jeff Zola
Proceedings Volume 5755, (2005) https://doi.org/10.1117/12.599997
KEYWORDS: Etching, Plasma, Semiconducting wafers, Plasma etching, Wafer testing, Statistical analysis, Data modeling, Oxides, Error analysis, Process control

Proceedings Article | 17 May 2005 Paper
James McNames, Byungsool Moon, Bruce Whitefield, David Abercrombie
Proceedings Volume 5755, (2005) https://doi.org/10.1117/12.600198
KEYWORDS: Semiconducting wafers, Reticles, Data modeling, Optimization (mathematics), Statistical analysis, Photomasks, Optical lithography, Etching, Semiconductor manufacturing, Process modeling

Proceedings Article | 17 May 2005 Paper
Byungsool Moon, James McNames, Bruce Whitefield, Paul Rudolph, Jeff Zola
Proceedings Volume 5755, (2005) https://doi.org/10.1117/12.600217
KEYWORDS: Semiconducting wafers, Monte Carlo methods, Inspection, Detection and tracking algorithms, Signal to noise ratio, Manufacturing, Algorithm development, Statistical analysis, Sensors, Semiconductor manufacturing

SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top