Jong-won Kim
at SAMSUNG Electronics Co Ltd
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 20 October 2006 Paper
Proceedings Volume 6349, 63493X (2006) https://doi.org/10.1117/12.686489
KEYWORDS: Manufacturing, Photomasks, Optical proximity correction, Resolution enhancement technologies, Semiconductors, Electronics, Data centers, Distributed computing, Network architectures, Local area networks

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