Dr. Marek Stehlik Profile

Dr. Marek Stehlik

at University of Rochester

SPIE Involvement:

Author

Publications (7)

Proceedings Article | 18 December 2024 Presentation

Investigation of damage initiation and damage growth of dielectric mirrors under 351-nm, nanosecond laser pulses

Marek Stehlik, Alexei Kozlov, Kyle Kafka, Brittany Hoffman, Sara MacNally, Amy Rigatti, Stavros Demos

Proceedings Volume PC13190, PC1319003 (2024) https://doi.org/10.1117/12.3032761

KEYWORDS: Nanosecond lasers, Laser optics, Dielectrics, Dielectric mirrors, Coating, Ultraviolet radiation, UV optics, Optical limiting, Optical design, Optical components

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Proceedings Article | 2 December 2022 Poster + Presentation + Paper

Sub-ps MHz green laser-induced contamination on dielectric coatings in air

Marek Stehlík, Janis Zideluns, Frank Wagner, Fabien Lemarchand, Camille Petite, Antonin Moreau, Aude Lereu, Marco Minissale, Julien Lumeau, Laurent Gallais

Proceedings Volume 12300, 123000A (2022) https://doi.org/10.1117/12.2642516

KEYWORDS: Contamination, Niobium, Dielectrics, Optical coatings, Thin films, Optical components, Laser applications, Deposition processes, Optical testing, Silica, Hafnium

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Proceedings Article | 2 December 2022 Presentation + Paper

Sub-ps 1030 nm laser-induced damage threshold evaluation of pulsed-laser deposited sesquioxides and magnetron-sputtered metal oxide optical coatings

Marek Stehlík, Goby Govindassamy, Janis Zideluns, Fabien Lemarchand, Frank Wagner, Julien Lumeau, Jacob Mackenzie, Laurent Gallais

Proceedings Volume 12300, 123000G (2022) https://doi.org/10.1117/12.2641792

KEYWORDS: Lutetium, Sapphire, Aluminum, Refractive index, Laser induced damage, Niobium, Laser damage threshold, Oxides, Scandium, Yttrium

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SPIE Journal Paper | 18 May 2022 Open Access

Sub-picosecond 1030 nm laser-induced damage threshold evaluation of pulsed-laser deposited sesquioxide thin films (Erratum)

Marek Stehlik, Goby Govindassamy, Janis Zideluns, Fabien Le Marchand, Frank Wagner, Julien Lumeau, Jacob Mackenzie, Laurent Gallais

OE, Vol. 61, Issue 07, 079801, (May 2022) https://doi.org/10.1117/12.10.1117/1.OE.61.7.079801

KEYWORDS: Thin films, Thin film deposition, Laser induced damage, Laser damage threshold, Optical engineering, Optoelectronics

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SPIE Journal Paper | 23 April 2022 Open Access

Sub-picosecond 1030 nm laser-induced damage threshold evaluation of pulsed-laser deposited sesquioxide thin films

Marek Stehlik, Goby Govindassamy, Janis Zideluns, Fabien Lemarchand, Frank Wagner, Julien Lumeau, Jacob Mackenzie, Laurent Gallais

OE, Vol. 61, Issue 07, 071603, (April 2022) https://doi.org/10.1117/12.10.1117/1.OE.61.7.071603

KEYWORDS: Lutetium, Laser induced damage, Hybrid fiber optics, Aluminum, Laser damage threshold, Sapphire, Refractive index, YAG lasers, Thin films, Niobium

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Proceedings Article | 12 October 2021 Poster + Presentation

Laser-induced contamination on dielectric coatings in sub-ps MHz regime at 515 nm

Marek Stehlik, Frank Wagner, Janis Zideluns, Fabien Lemarchand, Julien Lumeau, Laurent Gallais

Proceedings Volume 11910, 119101Q (2021) https://doi.org/10.1117/12.2598856

KEYWORDS: Dielectrics, Contamination, Laser marking, Laser drilling, Ionization, Semiconductor lasers, Reliability, Oxides, Optical filters, Optical design

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Proceedings Article | 12 October 2021 Presentation

Investigation on beam-size effect on sub-picosecond LIDT of dielectric oxide coatings

Marek Stehlik, Frank Wagner, Janis Zideluns, Fabien Lemarchand, Julien Lumeau, Laurent Gallais

Proceedings Volume 11910, 119100U (2021) https://doi.org/10.1117/12.2598855

KEYWORDS: Dielectrics, Laser induced damage, Optical coatings, Laser damage threshold, Oxides, Optical components, Pulsed laser operation, Contamination, Absorption, Testing and analysis

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Showing 5 of 7 publications

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