Dr. Oleksandr M. Vasilevskyi
Professor at The University of Texas at Austin.
SPIE Involvement:
Author
Area of Expertise:
Measurement Uncertainty , Additive Manufacturing , Tolerance Interval , Metrology , Control , Measurements and Quality Control
Websites:
Profile Summary

Doctor of engineering sciences, professor (full), Senior Researcher in the Walker Department of Mechanical Engineering at the University of Texas at Austin (USA).

Dr. Vasilevskyi's research interests include the design and development of measurement techniques, equipment for controlling additive manufacturing, studying the processes of direct laser sintering of metal powders and monitoring their quality, equipment for measuring biophysical characteristics, automatic control systems for electric motors, instruments for measuring ion concentrations, and methodologies for evaluating measurement uncertainty.

Member of the Institute of Electrical and Electronics Engineers (IEEE).
The badge of the Ministry of Education and Science of Ukraine is "For scientific and educational achievements" (2020).
Laureate of the Prize of the Verkhovna Rada of Ukraine for Young Scientists (2019).
Publications (7)

Proceedings Article | 16 December 2024 Paper
Proceedings Volume 13400, 134000Q (2024) https://doi.org/10.1117/12.3058548

Proceedings Article | 12 December 2022 Paper
Proceedings Volume 12476, 124760S (2022) https://doi.org/10.1117/12.2660161
KEYWORDS: Digital signal processing, Signal processing, Fiber optics, Telecommunications, Statistical analysis, Signal attenuation, Analog electronics, Analytical research, Phase shift keying, Fourier transforms

Proceedings Article | 1 October 2018 Paper
Oleksandr Vasilevskyi, Pavlo Kulakov, Dmytro Kompanets, Oleksander Lysenko, Vasyl Prysyazhnyuk, Waldemar Wójcik, Doszhon Baitussupov
Proceedings Volume 10808, 108082E (2018) https://doi.org/10.1117/12.2501578
KEYWORDS: Measurement devices, Transducers, Mathematical modeling, Instrument modeling, Quality measurement, Differential equations, Error analysis, Spectral models, Reliability, Metrology

Proceedings Article | 1 October 2018 Paper
Oleksandr Vasilevskyi, Volodymyr Didych, Anna Kravchenko, Maksym Yakovlev, Iryna Andrikevych, Dmytro Kompanets, Yevhen Danylyuk, Waldemar Wójcik, Askhat Nurmakhambetov
Proceedings Volume 10808, 108082C (2018) https://doi.org/10.1117/12.2501576
KEYWORDS: Ions, Metrology, Manufacturing, Tolerancing, Electrodes, Temperature metrology, Measurement devices, Power supplies, Sensors, Environmental sensing

Proceedings Article | 1 October 2018 Paper
Proceedings Volume 10808, 108080Y (2018) https://doi.org/10.1117/12.2501605
KEYWORDS: Visible radiation, Optical amplifiers, Mathematical modeling, Photodiodes, Water, Mass attenuation coefficient, Sensors, Resistance, Absorbance, Eye

Showing 5 of 7 publications
Conference Committee Involvement (2)
II International scientific and practical conference "Information and measurement technologies"
13 November 2024 |
MECHATRONIC SYSTEMS: INNOVATION AND ENGINEERING (MSIE 2023)
23 November 2023 |
Course Instructor
NON-SPIE: Foundations of Measurement Uncertainty Theory
Concept of measurement uncertainty: type A and type B measurement uncertainty, standard uncertainty, combined uncertainty, extended uncertainty, relative uncertainty. Evaluation of direct and indirect measurements.
NON-SPIE: Fundamentals of metrology and measuring technology
Knowledge of the fundamentals of metrology is provided, covering concepts of measurement and error theory, as well as the properties of measuring instruments. The course examines tools for measuring voltage, frequency, angular velocity, and torque...
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