Mr. Samuel Bucourt Profile

Samuel Bucourt

CEO and President at Imagine Optic SA

Area of Expertise:

wavefront sensing , adaptive optics , optical metrology , deformable mirror , ultraintense laser , superresolution microscopy

Websites:

Company Website

Publications (12)

Proceedings Article | 13 March 2024 Presentation

CIAO: an on-the-shelf adaptive optics system for FSO

Guillaume Dovillaire, Cora Leveder, Samuel Bucourt

Proceedings Volume 12877, 128770X (2024) https://doi.org/10.1117/12.3002307

KEYWORDS: Telescopes, Adaptive optics, Free space optics, Wavefronts, Deformable mirrors, Astronomy, Wavefront sensors, Visible radiation, Single mode fibers, Short wave infrared radiation

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Proceedings Article | 29 August 2022 Presentation

A new generation of SHWFS with dramatically improved spatial resolution dedicated to high performance optical metrology

Jerôme Ballesta, Xavier Levecq, Samuel Bucourt

Proceedings Volume 12188, 121881G (2022) https://doi.org/10.1117/12.2630579

KEYWORDS: Spatial resolution, Optical metrology, Wavefront sensors, Wavefronts, Short wave infrared radiation, Shape analysis, Optical alignment, Metrology, Laser optics, Laser metrology

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Proceedings Article | 14 May 2019 Presentation

Hartmann wavefront sensor in the EUV and hard X-ray range for source metrology and beamline optimization (Conference Presentation)

Ombeline de La Rochefoucauld, Samuel Bucourt, Daniele Cocco, Guillaume Dovillaire, Fabrice Harms, Mourad Idir, Dietmar Korn, Xavier Levecq, Martin Piponnier, Rakchanok Rungsawang, Philippe Zeitoun

Proceedings Volume 11036, 110360P (2019) https://doi.org/10.1117/12.2522521

KEYWORDS: Extreme ultraviolet, Metrology, Wavefront sensors, Hard x-rays, Sensors, Ultrafast imaging, X-rays, X-ray sources, Free electron lasers, High harmonic generation

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Proceedings Article | 13 May 2019 Presentation

EUV/X-ray Hartmann wavefront sensors and adaptive optics at Imagine Optic (Conference Presentation)

Ombeline de La Rochefoucauld, Samuel Bucourt, Daniele Cocco, Guillaume Dovillaire, Fabrice Harms, Mourad Idir, Dietmar Korn, Xavier Levecq, Martin Piponnier, Rakchanok Rungsawang, Lorenzo Raimondi, Philippe Zeitoun

Proceedings Volume 11032, 1103207 (2019) https://doi.org/10.1117/12.2522510

KEYWORDS: Adaptive optics, Optics manufacturing, Sensors, Wavefront sensors, Extreme ultraviolet, X-ray optics, Wavefronts, Optical alignment, Metrology, Mirrors

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Proceedings Article | 2 October 2018 Presentation + Paper

Developments of EUV/x-ray wavefront sensors and adaptive optics at Imagine Optic

Ombeline de La Rochefoucauld, Samuel Bucourt, Daniele Cocco, Guillaume Dovillaire, Fabrice Harms, Mourad Idir, Dietmar Korn, Xavier Levecq, Agathe Marmin, Lionel Nicolas, Martin Piponnier, Lorenzo Raimondi, Philippe Zeitoun

Proceedings Volume 10761, 107610E (2018) https://doi.org/10.1117/12.2320927

KEYWORDS: Sensors, Wavefronts, Extreme ultraviolet, Wavefront sensors, Mirrors, X-rays, X-ray optics, Adaptive optics, Monochromatic aberrations, EUV optics

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Proceedings Article | 29 September 2010 Paper

Hartmann wavefront sensor and adaptive x-ray optics developments for synchrotron applications

Pascal Mercère, Mourad Idir, Guillaume Dovillaire, Xavier Levecq, Samuel Bucourt, Lionnel Escolano, Paul Sauvageot

Proceedings Volume 7803, 780302 (2010) https://doi.org/10.1117/12.860990

KEYWORDS: Mirrors, Actuators, X-rays, Deformable mirrors, Wavefront sensors, X-ray optics, Wavefronts, Photovoltaics, Synchrotron radiation, Metrology

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Proceedings Article | 3 October 2008 Paper

Determination of flatness on patterned wafer surfaces using wavefront sensing methods

A. Nutsch, L. Pfitzner, T. Grandin, X. Levecq, S. Bucourt

Proceedings Volume 7155, 71550Z (2008) https://doi.org/10.1117/12.814535

KEYWORDS: Semiconducting wafers, Wavefront sensors, Wavefronts, Sensors, Calibration, Chemical mechanical planarization, Metrology, Gaussian filters, Reflectivity, Semiconductor manufacturing

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Proceedings Article | 1 October 2007 Paper

High order harmonics wavefront measurement and optimization

J. Gautier, A. Morlens, P. Zeitoun, E. Papalarazou, G. Rey, C. Valentin, J. Goddet, S. Sebban, Guillaume Dovillaire, Xavier Levecq, Samuel Bucourt

Proceedings Volume 6704, 670403 (2007) https://doi.org/10.1117/12.732339

KEYWORDS: Wavefronts, Sensors, Calibration, X-rays, Monochromatic aberrations, Infrared radiation, Extreme ultraviolet, High harmonic generation, Argon, X-ray optics

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Proceedings Article | 18 June 2007 Paper

Surface metrology with a stitching Shack-Hartmann profilometric head

J. Floriot, X. Levecq, S. Bucourt, M. Thomasset, F. Polack, M. Idir, P. Mercère, S. Brochet, T. Moreno

Proceedings Volume 6616, 66162A (2007) https://doi.org/10.1117/12.726058

KEYWORDS: Wavefront sensors, Mirrors, Head, Wavefronts, Spherical lenses, Metrology, Calibration, Microlens, Synchrotrons, Surface finishing

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Proceedings Article | 17 September 2005 Paper

X-ray beam metrology and X-ray optic alignment by Hartmann wavefront sensing

Pascal Mercere, Samuel Bucourt, Gilles Cauchon, Denis Douillet, Guillaume Dovillaire, Kenneth Goldberg, Mourad Idir, Xavier Levecq, Thierry Moreno, Patrick Naulleau, Senajith Rekawa, Philippe Zeitoun

Proceedings Volume 5921, 592109 (2005) https://doi.org/10.1117/12.622799

KEYWORDS: Extreme ultraviolet, Sensors, Imaging systems, Mirrors, X-rays, Hard x-rays, X-ray optics, Calibration, Active optics, Wavefront sensors

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Proceedings Article | 19 December 2003 Paper

New techniques for the measurement of x-ray beam or x-ray optics quality

Philippe Zeitoun, Philippe Balcou, Samuel Bucourt, Djamel Benredjem, Franck Delmotte, Guillaume Dovillaire, Denis Douillet, James Dunn, G. Faivre, Marta Fajardo, Kenneth Goldberg, Mourad Idir, Sebastien Hubert, Jim Hunter, Sylvie Jacquemot, Sophie Kazamias, Sebastien le Pape, Xavier Levecq, Ciaran Lewis, Remy Marmoret, Pascal Mercere, A. Morlens, Patrick Naulleau, Christian Remond, Jorge Rocca, Stephane Sebban, Raymond Smith, Marie-Francoise Ravet, Philippe Troussel, Constance Valentin, Laurent Vanbostal

Proceedings Volume 5197, (2003) https://doi.org/10.1117/12.508183

KEYWORDS: Wavefronts, X-ray lasers, Wavefront sensors, Extreme ultraviolet, Plasma, Mirrors, Interferometers, Picosecond phenomena, Michelson interferometers, X-ray optics

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Proceedings Article | 16 October 2002 Paper

Dynamic study of a Varioptic variable focal lens

Claude Gabay, Bruno Berge, Guillaume Dovillaire, Samuel Bucourt

Proceedings Volume 4767, (2002) https://doi.org/10.1117/12.468224

KEYWORDS: Wavefronts, Liquids, Interfaces, Wavefront distortions, Spherical lenses, Solids, Prototyping, Optical fibers, CCD image sensors, Liquid crystals

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Showing 5 of 12 publications

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