Dr. Christophe Hecquet
at Institut Fresnel
SPIE Involvement:
Author
Publications (11)

Proceedings Article | 17 November 2017 Open Access Paper
R. Le Goff, H. Krol, C. Grèzes-Besset, M. Lequime, T. Bégou, C. Hecquet, M. Zerrad, B. Badoil, G. Montay, K. Gasc
Proceedings Volume 10563, 1056305 (2017) https://doi.org/10.1117/12.2304107
KEYWORDS: Semiconducting wafers, Optical filters, Glasses, Sensors, Optical coatings, Manufacturing, Transmittance, Astronomical imaging, Charge-coupled devices, Remote sensing

Proceedings Article | 17 November 2017 Open Access Paper
Proceedings Volume 10563, 1056306 (2017) https://doi.org/10.1117/12.2304155
KEYWORDS: Optical filters, Ultraviolet radiation, Optical filtering, Sputter deposition, Astronomical imaging, Plasma, Refractive index, Glasses, Light scattering, Niobium

Proceedings Article | 2 October 2015 Paper
Proceedings Volume 9627, 962718 (2015) https://doi.org/10.1117/12.2192983
KEYWORDS: Thin films, Ultraviolet radiation, Laser damage threshold, Laser induced damage, Absorption, Silica, Ions, Ionization, UV optics, Femtosecond phenomena

Proceedings Article | 31 October 2014 Paper
Proceedings Volume 9237, 92371A (2014) https://doi.org/10.1117/12.2068178
KEYWORDS: Digital image correlation, Cameras, Laser induced damage, Phase imaging, Sensors, Laser damage threshold, Microscopes, Damage detection, Interferometry, Refractive index

Proceedings Article | 31 October 2014 Paper
Proceedings Volume 9237, 92370I (2014) https://doi.org/10.1117/12.2068176
KEYWORDS: Silica, Sputter deposition, Ultraviolet radiation, Laser induced damage, Refractive index, Laser damage threshold, Infrared lasers, Thin films, Neodymium, Plasma

Proceedings Article | 4 December 2012 Paper
Proceedings Volume 8530, 853026 (2012) https://doi.org/10.1117/12.976839
KEYWORDS: Laser induced damage, Silica, Confocal microscopy, Carbon dioxide lasers, Polishing, UV optics, Microscopes, Laser damage threshold, Ultraviolet radiation, Solids

Proceedings Article | 18 May 2009 Paper
Proceedings Volume 7361, 736110 (2009) https://doi.org/10.1117/12.822950
KEYWORDS: Laser damage threshold, Polymethylmethacrylate, Silicon carbide, Mirrors, Free electron lasers, Digital image correlation, Atomic force microscopy, Zinc, Laser ablation, Coating

Proceedings Article | 30 April 2009 Paper
P. Jonnard, K. Le Guen, M.-H. Hu, J.-M. André, E. Meltchakov, C. Hecquet, F. Delmotte, A. Galtayries
Proceedings Volume 7360, 73600O (2009) https://doi.org/10.1117/12.820913
KEYWORDS: Silicon, Aluminum, Silicon carbide, Multilayers, Molybdenum, Ions, Interfaces, X-rays, Reflectivity, Chemical species

Proceedings Article | 3 April 2008 Paper
R. Mercier Ythier, X. Bozec, R. Geyl, A. Rinchet, Christophe Hecquet, Marie-Françoise Ravet-Krill, Franck Delmotte, Benoît Sassolas, Raffaele Flaminio, Jean-Marie Mackowski, Christophe Michel, Jean-Luc Montorio, Nazario Morgado, Laurent Pinard, Elodie Roméo
Proceedings Volume 6921, 692135 (2008) https://doi.org/10.1117/12.787620
KEYWORDS: Reflectivity, Mirrors, Coating, Extreme ultraviolet, Plasma, Manufacturing, Polishing, Annealing, Grazing incidence, Silicon carbide

Proceedings Article | 3 October 2007 Paper
Frédéric Auchère, Marie-Françoise Ravet-Krill, John Moses, Frédéric Rouesnel, Jean-Pierre Moalic, Denis Barbet, Christophe Hecquet, Arnaud Jérome, Raymond Mercier, Jean-Christophe Leclec'h, Franck Delmotte, Jeffrey Newmark
Proceedings Volume 6689, 66890A (2007) https://doi.org/10.1117/12.751447
KEYWORDS: Coronagraphy, Reflectivity, Mirrors, Multilayers, Coating, Extreme ultraviolet, Helium, Solar processes, Rockets, Stray light

Proceedings Article | 18 May 2007 Paper
Christophe Hecquet, Marie-Françoise Ravet-Krill, Franck Delmotte, Arnaud Jérôme, Aurélie Hardouin, Françoise Bridou, Françoise Varnière, Marc Roulliay, Frédéric Bourcier, Jean-Michel Desmarres, Vincent Costes, Jacques Berthon, André Rinchet, Roland Geyl
Proceedings Volume 6586, 65860X (2007) https://doi.org/10.1117/12.723483
KEYWORDS: Reflectivity, Extreme ultraviolet, Multilayers, Extreme ultraviolet lithography, Humidity, Annealing, Reflectometry, Silicon carbide, Silicon, Space operations

Showing 5 of 11 publications
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