Francesca Chiocchetta
at Univ. degli Studi di Padova
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 5 March 2022 Presentation + Paper
Proceedings Volume 12001, 120010D (2022) https://doi.org/10.1117/12.2609666
KEYWORDS: Field effect transistors, Electrons, Reliability, Doping, Gallium nitride, Iron, Carbon, Device simulation, Amplifiers, Physics

Proceedings Article | 1 March 2019 Presentation + Paper
Proceedings Volume 10918, 1091817 (2019) https://doi.org/10.1117/12.2511145
KEYWORDS: Gallium nitride, Transistors, Reliability, Field effect transistors, Failure analysis, Diodes, Dielectrics, Diffusion, Physics, Microscopy

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