Jun-Hyung Lee
SPIE Involvement:
Author
Publications (3)

Proceedings Article | 1 December 2022 Poster + Paper
Proceedings Volume 12292, 122920S (2022) https://doi.org/10.1117/12.2643119
KEYWORDS: Pellicles, Particles, Extreme ultraviolet, Graphene, Silicon carbide, Transmittance, Extreme ultraviolet lithography, Photomasks, Image processing, Semiconducting wafers

Proceedings Article | 31 October 2022 Poster
Proceedings Volume PC12292, PC122920R (2022) https://doi.org/10.1117/12.2643047
KEYWORDS: Extreme ultraviolet lithography, Critical dimension metrology, Absorption, Thin films, Semiconducting wafers, Photoresist materials, Overlay metrology, Thin film manufacturing, Thin film deposition, Semiconductors

Proceedings Article | 26 May 2022 Poster + Paper
Proceedings Volume 12051, 120510O (2022) https://doi.org/10.1117/12.2613984
KEYWORDS: Reflectivity, Nanoimprint lithography, Photomasks, Extreme ultraviolet, Phase shifts, Stochastic processes, Critical dimension metrology, Optical lithography, Extreme ultraviolet lithography, 3D image processing

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