Dr. Sen Zhou
at Chongqing Institute of Metrology and Quality Inspection
SPIE Involvement:
Author
Publications (24)

Proceedings Article | 28 May 2024 Poster + Paper
Proceedings Volume 13083, 1308316 (2024) https://doi.org/10.1117/12.3019560
KEYWORDS: 3D metrology, Teeth, 3D modeling, Laser scanners, Manufacturing, Metrology, Inspection, Data modeling, Beam path, Point clouds

Proceedings Article | 28 May 2024 Poster + Paper
Proceedings Volume 13083, 1308315 (2024) https://doi.org/10.1117/12.3018671
KEYWORDS: Sensors, Calibration, Sensor calibration, Control systems, Microelectromechanical systems, Metrology, Autocollimators, Accelerometers, Resistance, Optical gratings

Proceedings Article | 27 November 2023 Paper
Proceedings Volume 12769, 127690J (2023) https://doi.org/10.1117/12.2684550
KEYWORDS: Teeth, 3D metrology, Laser scanners, Manufacturing, Beam path, Metrology, Inspection, 3D modeling, Industry, Data processing

Proceedings Article | 4 April 2023 Paper
Proceedings Volume 12617, 1261774 (2023) https://doi.org/10.1117/12.2666786
KEYWORDS: Sensors, Laser systems engineering, Laser interferometry, Calibration, Autocollimators, Metrology, Error control coding, Optical encoders, Lithium, Interpolation

Proceedings Article | 4 January 2023 Presentation + Paper
Proceedings Volume 12317, 1231717 (2023) https://doi.org/10.1117/12.2645581
KEYWORDS: Scanning electron microscopy, Electron microscopes, Technology, Standards development, Shape analysis, Error analysis, Transmission electron microscopy, Inspection, Image analysis, Metrology

Showing 5 of 24 publications
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