Dr. Tsung-Sheng Kang
at IBM Corp
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 13 June 2022 Presentation
Proceedings Volume PC12056, PC120560A (2022) https://doi.org/10.1117/12.2614316
KEYWORDS: Optical lithography, Etching, Plasma etching, Plasma, Nanotechnology, Extreme ultraviolet, Line width roughness, Ions, Fin field effect transistors, Extreme ultraviolet lithography

Proceedings Article | 22 February 2021 Presentation
Proceedings Volume 11609, 116090S (2021) https://doi.org/10.1117/12.2583897

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