Dr. Erik Novak
at 4D Technology Corp
SPIE Involvement:
Editor | Author
Publications (32)

Proceedings Article | 9 September 2021 Open Access Presentation + Paper
Proceedings Volume 11813, 1181309 (2021) https://doi.org/10.1117/12.2571271
KEYWORDS: Semiconductors, Metrology, Interferometry, Interferometers, Packaging, National Ignition Facility, Mirrors, Eye, Data storage, Semiconductor materials

Proceedings Article | 3 September 2019 Presentation + Paper
Proceedings Volume 11102, 1110212 (2019) https://doi.org/10.1117/12.2530693
KEYWORDS: 3D metrology, Structured light, Cameras, Fringe analysis, Polarization, Imaging systems, Polarizers, Interferometry, Visualization, Projection systems

Proceedings Article | 7 September 2018 Paper
Joanna Schmit, Erik Novak, Shawn McDermed
Proceedings Volume 10834, 108342F (2018) https://doi.org/10.1117/12.2322178
KEYWORDS: Structured light, Inspection, 3D metrology, Fringe analysis, Polarization, Interferometry

Proceedings Article | 14 May 2018 Presentation + Paper
Erik Novak, Shawn McDermed , Kevin Harding
Proceedings Volume 10667, 106670I (2018) https://doi.org/10.1117/12.2309580
KEYWORDS: Phase shifts, Polarization, 3D metrology, Aerospace engineering, Metals, Structured light, Inspection, Spatial resolution, Additive manufacturing, Mirrors

SPIE Journal Paper | 8 September 2017 Open Access
OE, Vol. 56, Issue 11, 111701, (September 2017) https://doi.org/10.1117/12.10.1117/1.OE.56.11.111701
KEYWORDS: Interferometry, Metrology, Optical engineering, Interferometers, Optics manufacturing, Microscopy, Distance measurement, Physics, Optical fabrication, Speckle

Showing 5 of 32 publications
Proceedings Volume Editor (13)

SPIE Conference Volume | 16 October 2023

SPIE Conference Volume | 30 August 2021

SPIE Conference Volume | 4 November 2019

SPIE Conference Volume | 11 December 2017

SPIE Conference Volume | 10 September 2015

Showing 5 of 13 publications
Conference Committee Involvement (19)
Applied Optical Metrology V
22 August 2023 | San Diego, California, United States
Applied Optical Metrology IV
4 August 2021 | San Diego, California, United States
Applied Optical Metrology III
13 August 2019 | San Diego, California, United States
Applied Optical Metrology II
8 August 2017 | San Diego, California, United States
Interferometry XVIII
30 August 2016 | San Diego, California, United States
Showing 5 of 19 Conference Committees
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